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  • 512639

    us

    A processor acquires a first radiation image and a second radiation image which are acquired by imaging a subject, based on radiation having different energy distributions, performs sharpness conversion processing on at least one of the first radiation image or the second radiation image to make sharpness of the first radiation image and the second radiation image uniform, and derives a component image in which a specific component in the subject is emphasized, based on the first radiation image and the second radiation image which are subjected to the sharpness conversion processing.
    • 출원번호 : 18887043
    • 출원인 : TAKAHASHI, Tomoyuki
    • 특허번호 :
    • IPC : G01T-001/29(2006.01);G06T-005/50(2006.01);G06T-005/73(2024.01);
  • 512638

    us

    A processor acquires a fluoroscopic image captured by a radiation fluoroscopy device having a C-arm, detects a plurality of feature points of a structure included in the fluoroscopic image, derives a rotation angle of the fluoroscopic image from a reference based on the plurality of detected feature points, and rotates and displays the fluoroscopic image based on the derived rotation angle.
    • 출원번호 : 18887041
    • 출원인 : HAMAUZU, Shin
    • 특허번호 :
    • IPC : A61B-006/00(2024.01)
  • 512637

    us

    A processor specifies a target bone, which is a target of state evaluation of a bone, from a radiation image of a subject, determines whether or not the state evaluation of the bone is possible based on a specification result of the target bone, derives an evaluation result by performing the state evaluation of the bone using the target bone in a case in which it is determined that the state evaluation of the bone is possible, and performs the state evaluation of the bone by changing an evaluation method in a case in which it is determined that the state evaluation of the bone is not possible.
    • 출원번호 : 18887046
    • 출원인 : TAKAHASHI, Tomoyuki
    • 특허번호 :
    • IPC : A61B-006/50(2024.01);A61B-006/00(2024.01);G06T-007/00(2017.01);G16H-050/20(2018.01);
  • 512636

    us

    A processor acquires first and second radiation images for a subject, which includes a first component of a plurality of compositions and a second component of a single composition, derives an initial second component image based on the first and second radiation images, specifies first and second component regions in the radiation images based on the initial second component image, derives a characteristic of the first component related to attenuation of the radiation based on the radiation images in the first component region, derives the characteristic of the first component in the second component region in the first or second radiation image based on the characteristic of the first component in the first component region around the second component region, and derives first and second component images in which the first and second components are emphasized, respectively, based on the characteristic of the first component.
    • 출원번호 : 18887040
    • 출원인 : TAKAHASHI, Tomoyuki
    • 특허번호 :
    • IPC : G06T-007/00(2017.01);A61B-006/00(2024.01);A61B-006/50(2024.01);
  • 512635

    us

    Provided is a measuring device for measuring a distance between the measuring device and a user. The measuring device includes a distance sensor configured to generate a distance signal indicative of the distance, an IR radiation sensor configured to generate a temperature signal indicative of the IR radiation emitted by the user, and a control unit. The control unit is configured to: in a calibration mode, acquire the distance signal and the temperature signal respectively through the distance sensor and the IR radiation sensor and, on the basis of the distance signal and the temperature signal, generate a calibration curve which associates to each other values of the temperature signal with respective value of the distance; and in a calibrated mode, acquire the temperature signal through the IR radiation sensor and, on the basis of the temperature signal and the calibration curve, determine the distance.
    • 출원번호 : 18887631
    • 출원인 : STMicroelectronics International N.V.
    • 특허번호 :
    • IPC : G01J-005/80(2022.01);G01J-005/00(2022.01);G01S-017/08(2006.01);
  • 512634

    us

    A medical or dental handpiece is provided with a temperature measurement device for measuring the temperature of the handpiece or a part of the handpiece described. The temperature measurement device can be designed to measure the temperature of the handpiece or a part of the handpiece in a contact less manner by detecting electromagnetic radiation, in particular heat radiation from heat sources associated with the handpiece. Alternatively, the temperature measurement device may be configured to measure the temperature of the interior of the handpiece that can be heated by at least one heat source. Alternatively, the temperature measurement device can be an electrical temperature measurement device.
    • 출원번호 : 18888058
    • 출원인 : ALSHEHRI, OMAR MOHAMMED
    • 특허번호 :
    • IPC : A61C-001/12(2006.01);A61C-001/00(2006.01);A61C-001/08(2006.01);A61C-019/04(2006.01);G01J-005/00(2006.01);
  • 512633

    us

    We describe in this application systems and methods for autofocusing in imaging mass spectrometry. The present application describes improvements over current IMS and IMC apparatus and methods through an autofocus component including a plurality of apertures in the autofocus system, such as a plurality of apertures arranged in 2 dimensions. As a plurality of apertures is used, the autofocus system provides redundancy in the event that measurement of focus on the sample from the illuminating radiation passed through one or more of the apertures fails so as to reduce the number of unsuccessful autofocus attempts.
    • 출원번호 : 18887633
    • 출원인 : Standard BioTools Canada Inc.
    • 특허번호 :
    • IPC : G02B-021/24(2006.01);G01N-001/04(2006.01);G01N-033/543(2006.01);G02B-021/00(2006.01);G02B-021/26(2006.01);H01J-049/00(2006.01);H01J-049/10(2006.01);
  • 512632

    wo

    The disclosure regards a method for additive manufacturing an object, comprising the steps of providing a first radiation source emitting a first radiation; providing a container containing the photocurable resin curable by the first radiation, the container comprising a wall transparent or at least semi-transparent to at least a part of the first radiation; providing a second radiation source, wherein the photocurable resin is non-curable by said second radiation source; determining at least one property of the wall by measuring a second radiation from or reflected by the wall; providing a surface submerged on the container containing the resin; and controlling a set of processing parameters based on the at least one property of the wall for forming at least one layer of an object by curing a part of the photocurable resin on the submerged surface.
    • 출원번호 : EP2024/075935
    • 출원인 : DANMARKS TEKNISKE UNIVERSITET
    • 특허번호 :
    • IPC : B29C-064/124(2017.01);B29C-064/245(2017.01);B29C-064/277(2017.01);B29C-064/393(2017.01);B33Y-010/00(2015.01);B33Y-030/00(2015.01);B33Y-050/02(2015.01);
  • 512631

    wo

    A specialized machine learning model is configured to minimize and/or eliminate the need for motorized hardware used to block higher order diffracted radiation from corrupting alignment measurements in a semiconductor manufacturing metrology process. For example, a radiation source irradiates a metrology target in a layer of a patterned substrate with radiation, which diffracts the radiation. A radiation sensor outputs phase data and intensity data for the diffracted radiation. The phase data comprises different energies associated with different diffraction orders of the diffracted radiation. The model is configured to determine a subset of intensity data associated with positive and negative first order diffracted radiation incident on a radiation sensor based on phase data, and determine an intensity difference or intensity imbalance between the positive and negative first order diffracted radiation based on the subset of the intensity data. Alignment is determined based on the intensity imbalance.
    • 출원번호 : EP2024/075957
    • 출원인 : ASML NETHERLANDS B.V.
    • 특허번호 :
    • IPC : G03F-007/00(2006.01)
  • 512630

    ep

    The present disclosure discloses mounting seat and drying apparatus, the drying apparatus having an airflow channel and one or more one or more radiation sources. mounting seat comprises a mounting portion and a hollow portion, the mounting portion being available for mounting of the one or more radiation sources; and in any of the perpendiculars of the mounting seat to the first axis (m) in section, the hollow portion extends from a first edge of the mounting seat to a second edge.
    • 출원번호 : 24200446.3
    • 출원인 : SZ Zuvi Technology Co., Ltd.
    • 특허번호 :
    • IPC : A45D-020/12(2006.01);A47K-010/48(2006.01);